@article {ref162,
	title = "WaferSegClassNet - A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects",
	year = "2022",
	author = "Subhrajit Nag and Dhruv Makwana and R Sai Chandra Teja and Sparsh Mittal and C Krishna Mohan",
	journal = "Computers in industry",
}